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3 Critical Steps for Precise Sample Preparation

Data integrity in analytical spectroscopy studies is dependent upon the performance of integral components and the method of sample preparation. This is true of both x-ray fluorescence (XRF) and inductively-coupled plasma (ICP) techniques, which analyze extremely low-level optical signals to quantify the elemental composition of samples at the trace and ultra-trace scale.

Ongoing product care and calibration can minimize the potential for error from mechanical variations to negligible levels. This is a prerequisite for spectroscopy applications which must contend with avoidable phenomena such as laser drifting and the spalling of platinum labware. Optimal sample preparation, meanwhile, can be achieved through three critical steps.

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Why we developed the Phoenix GO range

Mark Bourke, Technology Division Operations Manager, talks about why we invested in the development of Phoenix GO.  Mark has been with XRF Scientific for over 20 years and is our group expert in Gas Fusion Machines.


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How Important is Crushing Equipment for XRF Sample Preparation?

X-ray fluorescence (XRF) analysis is a unique technology that comparatively measures the intensity of sub-visible x-rays emitted by a sample excited with an incident light. A comparative measurement in this context refers to the analysis of fluorescent signals against specific spectral fingerprints associated with elements on the periodic table. These excitation signals are weaker than the incident light by many factors of magnitude, requiring ultra-precise photodetectors and additional optics with outstanding out-of-band rejection. This highlights the importance of consistency in the field of XRF analysis.

It is possible to subject an unprepared surface area to XRF analysis. Handheld analyzers are routinely used in archaeological and mining applications. These components are ass...

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